Description

Key Features

• 1 GHz maximum sampling rate
• 32 channels
• More than 100 MHz input bandwidth
• 1 Meg Samples/channel maximum
• 8-bit pattern generator
• 4 Independent variable thresholds
• Digital logger
• Versatile triggering options, including glitch capture
• External clock input
• Extended capture time function
• Quality SMD grabber test clips
• High speed USB2 connection to PC
• No external power supply
• Runs on Windows 98/ME/2000/XP…

The software for the LA-Gold-36 is mature and both the logic analyzer and pattern generator are controlled from a single, intuitive user interface.

The LA-Gold-36’s integrated pattern generator can be used in conjunction with the logic analyzer. The user can set up the instrument to output data to the unit under test (UUT) with the pattern generator and then measure its response with the logic analyzer. This, and other flexible triggering options for both the logic analyzer and pattern generator functions, makes the LA-Gold-36 a cut above the rest.

The LA-Gold-36 connects to the PC via USB2.0 for rapid display updates.

The flexible triggering options of the LA-Gold-36 make it possible to capture the exact data the user wants to view.

Edge triggering may be set to occur on a rising edge, falling edge or change-of-state on any one or combination of channels.

Pattern (level) conditions are set by specifying a ‘1’, ‘0’ or ‘X’ (don’t care) condition on all channels.

Combinations such as Edge OR Pattern, Edge AND Pattern, Edge THEN Pattern, Pattern THEN Edge, etc. may be set.

Pattern durations may be set to trigger when shorter (glitch capture), or longer than a specified period.

A ‘post trigger delay’ function allows the final data capture to be postponed by an accurate time after trigger detection.

The pattern generator, working in close combination with the logic analyzer, adds a new dimension to debugging possibilities.

The 8-channel pattern generator can output data at rates up to 50 MHz. The output pattern can be specified to come from a user file or from the ’Pattern Editor’.

It can be started on various conditions. It can, for example, start on a specific condition in the logic analyzer input signals, similar to a logic analyzer trigger condition.

The outputs of the pattern generator can act as inputs to the unit under test. The response from the unit under test can then be used to trigger the logic analyzer.